For checking Film thickness, Refractive index (N ,K ), Transmission, Reflection, CIE

With TE cooled CCD spectrometer, optical fiber and integrating sphere, this machine can test the film or coating thickness, many other features. The function of Optical Measurement System has been approved by many study institutions and famous manufactures in Taiwan , even in Japan and so on.

Owning the copy right of the software and the system, Optical Measurement System can be special designed for customers, and also can be applied to production line for quality control. We also have angle-changeable test machine with same test theory, but different structure for your choice.

• This system can be used to measure the film thickness (200-400, 000A ° )
• Quench coefficient (K value), Refraction coefficient (N value) and reflection of the film are measurable.
• Comparative spectrum can be added with transmission test function. (Suitable wavelength: 380-800nm)
• It can be adapted to immediate continuous production line monitoring.
• There is automatic test platform for option to execute automatic checking and record the result.
• 3D graph drawing function.
• It can add the CIE test function.

• High definition CCD spectrometer
• Optical fiber and integrating sphere
• Different illuminant for choice, such as Halogens, UV-VIS, UV-VIS-NIR, etc.
• Various working stage for option: manual, multifunctional, or automatic working stage
• Information System: Testing system and convenient document output system. Online and distant monitoring system is also for option.

• Optical coating with SiO2, NOx , ITO, Photoresist , Polysilicon , Polyemide , Nb2O5, etc.
• PLED & OLED film
• LCD module, Cell gap
• Attachment lens and average glass

Specification (Standard): FEATURES DESCRIPTION Spectrum Range 380~1050nm Option: 250~950 (UV Region) 800~1700 (NIR Region) Resolution 1.5 nm Measuring time 1 second Spot Size 2 mm diameter Precision 0.1mm Spectrometer 2048-elements CCD-Array Spectrometer Option: TE Cooled CCD Spectrometer Stage According to customers' request Light Source Tungsten Lamp, 380~1050nm Option: Tungsten and D2 lamp, 200~1100um D2 lamp, 250~400nm (For UV Region) Xenon lamp 250~1050nm Optical Fiber or Integrating Sphere For transmission measuring function 200μm optical fiber 1.5” integration sphere Display PC, Notebook Interface 16 bits, USB2.0/1.1 Software Film Smart thin-film thickness measurement software

For further information, you are more than welcome to contact us!!